| 1 |
v. 3
Colorimetric determination of traces of metals / E.B. Sandell
3rd ed., rev. and enl. - New York : Interscience Publishers , 1959
|
| 2 |
vol. 8
Colorimetric determination of nonmetals / editor, David F. Bolts ; authors, Sarah Black ... [et al.]
New York ; London : Interscience Publishers , 1958
|
| 3 |
v. 16
Complexation in analytical chemistry : a guide for the critical selection of analytical methods based on complexation reactions / Anders Ringbom
New York : Interscience Publishers , 1963
|
| 4 |
v. 19
Thermal analysis / Wesley Wm. Wendlandt
3rd ed. - New York : Wiley-Interscience , c1986
|
| 5 |
v. 23
The formation and properties of precipitates / [by] Alan G. Walton. With a contribution by Helga Füredi
New York : Interscience Publishers , 1967
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| 6 |
v. 24
Kinetics in analytical chemistry / Harry B. Mark, Jr. , Garry A. Rechnitz ; with the assistance of Ronald A. Greinke
New York : Interscience Publishers , 1968
|
| 7 |
v. 25
Atomic absorption spectroscopy / Walter Slavin
New York : Interscience Publishers , 1968
|
| 8 |
v. 28
The analytical chemistry of nitrogen and its compounds / edited by C. A. Streuli and P. R. Averell
pt. 1,pt. 2. - New York : Wiley-Interscience , c1970
|
| 9 |
v. 29
The analytical chemistry of sulfur and its compounds / J.H. Karchmer, editor
pt. 1,pt. 2,pt. 3. - New York : Wiley-Interscience , c1970-c1972
|
| 10 |
v. 30
Ultramicro elemental analysis / by Günther Tölg ; translated [from the German] by Conrad E. Thalmayer
New York ; Chichester : Wiley-Interscience , 1970
|
| 11 |
Vol. 42
Foundations of ultracentrifugal analysis / Hiroshi Fujita
New York : Wiley , c1975
|
| 12 |
v. 44
Microscale manipulations in chemistry / T.S. Ma, V. Horak
New York : Wiley , c1976
|
| 13 |
v. 51
Trace element analysis of geological materials / R. D. Reeves, R. R. Brooks
New York : Wiley , 1978
|
| 14 |
v. 57
Photoacoustics and photoacoustic spectroscopy / Allan Rosencwaig
New York : Wiley , c1980
|
| 15 |
v. 80
Selected methods of trace metal analysis : biological and environmental samples / Jon C. Van Loon
est.. - New York : Wiley , c1985
|
| 16 |
v. 92
X-ray absorption : principles, applications, techniques of EXAFS, SEXAFS, and XANES / edited by D.C. Koningsberger and R. Prins
New York : Wiley , c1988
|
| 17 |
v. 120
Remote sensing by Fourier transform spectrometry / Reinhard Beer
New York, N.Y. : Wiley , c1992
|
| 18 |
v. 127
Air monitoring by spectroscopic techniques / edited by Markus W. Sigrist
New York : Wiley , c1994
|
| 19 |
v. 171
Fourier transform infrared spectrometry / Peter R. Griffiths, James A. De Haseth
2nd ed. - Hoboken, N.J. : John Wiley & Sons, Inc. , c2007
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